发明授权
US07565597B1 Fast parity scan of memory arrays 有权
快速奇偶校验扫描存储器阵列

Fast parity scan of memory arrays
摘要:
A novel method for scanning bit parity in a memory array, and a circuit for implementing it, are disclosed. In a memory array that has one or more rows of memory cells, the method for checking data parity includes storing a plurality of data bits in the memory cells, scanning a row of memory cells independently of a memory read operation to ascertain the stored data bits; and determining parity for the row of memory cells by the results of the scanning. The method is accomplished by means of a dedicated parity scanning circuit.
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