发明授权
US07566626B1 System and method for providing a fully self aligned bipolar transistor using modified cavity formation to optimize selective epitaxial growth
有权
用于使用改进的空腔形成来提供完全自对准的双极晶体管的系统和方法,以优化选择性外延生长
- 专利标题: System and method for providing a fully self aligned bipolar transistor using modified cavity formation to optimize selective epitaxial growth
- 专利标题(中): 用于使用改进的空腔形成来提供完全自对准的双极晶体管的系统和方法,以优化选择性外延生长
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申请号: US11805417申请日: 2007-05-23
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公开(公告)号: US07566626B1公开(公告)日: 2009-07-28
- 发明人: Mingwei Xu , Jamal Ramdani
- 申请人: Mingwei Xu , Jamal Ramdani
- 申请人地址: US CA Santa Clara
- 专利权人: National Semiconductor Corporation
- 当前专利权人: National Semiconductor Corporation
- 当前专利权人地址: US CA Santa Clara
- 主分类号: H01L21/331
- IPC分类号: H01L21/331
摘要:
A system and method are disclosed for providing a fully self aligned bipolar transistor using modified cavity formation to optimize selective epitaxial growth. A collector of a transistor is formed and at least two layers of silicon oxide are formed above the collector and covered with a polysilicon external raised base. Then an emitter window is etched through the polysilicon external raised base down to the top layer of silicon oxide. A wet etch process is performed to form a cavity in the at least two layers of silicon oxide. Different wet etch rates of the silicon layers with respect to the wet etch process cause the cavity to be formed with a shape that optimizes selective epitaxial growth in the cavity. Polysilicon rich corners and a monocrystalline silicon base are then formed within the cavity.
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