Invention Grant
- Patent Title: Specific phase position detection circuit and method of the same
- Patent Title (中): 具体的相位检测电路及其方法相同
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Application No.: US11354829Application Date: 2006-02-16
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Publication No.: US07567632B2Publication Date: 2009-07-28
- Inventor: Kesatoshi Takeuchi
- Applicant: Kesatoshi Takeuchi
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2005-064691 20050309
- Main IPC: H03D1/00
- IPC: H03D1/00 ; H04L27/06

Abstract:
A specific phase position detection circuit of the invention includes: a measurement unit that detects two time positions where a signal level of an analog signal is matched with a preset threshold value, as a first reference position and a second reference position in each cycle of the analog signal, and measures a time length between the first reference position and the second reference position, as a reference time period; a computation unit that computes a time period at a preset rate to the reference time period measured in each previous cycle, as an additional time period in each current cycle of the analog signal; and a detection unit that detects a time position shifted from the first reference position detected in a current cycle by the additional time period computed by the computation unit, as the specific phase position, and outputs a detection signal representing the detected specific phase position. The positions having the substantially fixed positional relations to the peak positions are detectable as the specific phase positions in the respective cycles of an analog signal. The technique of the invention thus enables accurate specification of the peak positions even in the analog signal with varying amplitude.
Public/Granted literature
- US20060215797A1 Specific phase position detection circuit and method of the same Public/Granted day:2006-09-28
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