Invention Grant
US07567871B2 Automatic material labeling during spectral image data acquisition
有权
光谱图像数据采集期间的自动材料标签
- Patent Title: Automatic material labeling during spectral image data acquisition
- Patent Title (中): 光谱图像数据采集期间的自动材料标签
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Application No.: US11829518Application Date: 2007-07-27
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Publication No.: US07567871B2Publication Date: 2009-07-28
- Inventor: David B. Rohde , Patrick P. Camus
- Applicant: David B. Rohde , Patrick P. Camus
- Applicant Address: US WI Madison
- Assignee: Thermo Electron Scientific Instruments LLC
- Current Assignee: Thermo Electron Scientific Instruments LLC
- Current Assignee Address: US WI Madison
- Agency: DeWitt Ross & Stevens
- Agent Michael C. Staggs
- Main IPC: G01N31/00
- IPC: G01N31/00 ; G01R13/00

Abstract:
A system for performing spectral microanalysis delivers analysis results during the course of data collection. As spectra are collected from pixels on a specimen, the system periodically analyzes the spectra to statistically derive underlying spectra representing proposed specimen components, wherein the derived spectra combine in varying proportions to result (at least approximately) in the measured spectra at each pixel. Those pixels having the same dominant proposed component, and/or which contain at least approximately the same proportions of the proposed components, may then have their measured spectra combined (i.e., added or averaged). These spectra may then be cross-referenced via reference libraries to identify the components actually present. During the foregoing analysis, the measured spectra are preferably condensed, as by reducing the number of energy channels/intervals making up the measured spectra and/or by combining the measured spectra of adjacent pixels, to reduce the size of the data cube and expedite analysis results.
Public/Granted literature
- US20080027657A1 Automatic Material Labeling During Spectral Image Data Acquisition Public/Granted day:2008-01-31
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