发明授权
- 专利标题: Specimen holder for microscopic examinations
- 专利标题(中): 用于显微镜检查的标本支架
-
申请号: US11364039申请日: 2006-02-28
-
公开(公告)号: US07585469B2公开(公告)日: 2009-09-08
- 发明人: Heinz Zimmermann
- 申请人: Heinz Zimmermann
- 申请人地址: CH Heerbrugg
- 专利权人: Leica Microsystems (Schweiz) AG
- 当前专利权人: Leica Microsystems (Schweiz) AG
- 当前专利权人地址: CH Heerbrugg
- 代理机构: Hodgson Russ LLP
- 优先权: DE102005009756 20050303
- 主分类号: B01L3/00
- IPC分类号: B01L3/00 ; G02B3/00
摘要:
The invention relates to a specimen holder (10) for retaining specimens (9) for microscopic examination, which holder comprises two bars (3a, 3b) displaceable in opposite directions that are equipped on their mutually facing sides (7) with at least one respective recess (4a), in order to retain a specimen (9) by at least partial contact of those recesses against an outer edge of the specimen (9). It is proposed that the sides (7) of both bars (3, 3a, 3b) facing away from one another also be equipped with at least one respective recess (4b), so as thereby to increase the number of possibilities for specimen retention when both sides (7) of the bar (3a, 3b) are used by transposing the bars or by inserting them after a 180-degree rotation. It is further proposed to retain the bars (3a, 3b) magnetically on the specimen holder (10) so that the bars can easily be disassembled and reinserted following rotation.
公开/授权文献
- US20060198764A1 Specimen holder for microscopic examinations 公开/授权日:2006-09-07
信息查询
IPC分类: