发明授权
- 专利标题: Mass spectrometric system and mass spectrometry
- 专利标题(中): 质谱系统和质谱
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申请号: US10549587申请日: 2004-03-15
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公开(公告)号: US07586091B2公开(公告)日: 2009-09-08
- 发明人: Katsutoshi Takahashi , Kazuhiro Iida , Masakazu Baba , Noriyuki Iguchi , Toru Sano , Hisao Kawaura , Toshitsugu Sakamoto , Wataru Hattori , Hiroko Someya
- 申请人: Katsutoshi Takahashi , Kazuhiro Iida , Masakazu Baba , Noriyuki Iguchi , Toru Sano , Hisao Kawaura , Toshitsugu Sakamoto , Wataru Hattori , Hiroko Someya
- 申请人地址: JP Tokyo
- 专利权人: NEC Corporation
- 当前专利权人: NEC Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Scully, Scott, Murphy & Presser, P.C.
- 优先权: JP2003-069793 20030314
- 国际申请: PCT/JP2004/003427 WO 20040315
- 国际公布: WO2004/081555 WO 20040923
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
After a sample is previously separated into plural components in a channel formed in a microchip (353), the channel is irradiated along a separation direction with a laser beam from a laser oscillator (361) to sequentially ionize each fraction separated in the channel. The ionized fraction is detected by a mass spectrometry unit (363) and analyzed by an analytical result analyzing unit (371). The analytical result is stored in a memory (369) while associated with position information in a driver control unit (367) and information on laser beam irradiation condition in a laser control unit (373), and the analytical result is imaged by an imaging unit (375). The imaged analytical result is displayed on a display (377).
公开/授权文献
- US20060214101A1 Mass spectrometric system and mass spectrometry 公开/授权日:2006-09-28
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