发明授权
- 专利标题： System and method for testing voltage endurance
- 专利标题（中）： 用于测试耐电压的系统和方法
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申请号： US11836795申请日： 2007-08-10
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公开(公告)号： US07586315B2公开(公告)日： 2009-09-08
- 发明人: Shih-Fang Wong , Tsung-Jen Chuang , Jun Li
- 申请人： Shih-Fang Wong , Tsung-Jen Chuang , Jun Li
- 申请人地址： CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人： Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址： CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- 代理商 Frank R. Niranjan
- 优先权： CN200610157994 20061227
- 主分类号： G01R27/08
- IPC分类号： G01R27/08
摘要：
A method for testing voltage endurance of a electronic component, includes: generating an oscillating signal; amplifying the oscillating signal; transforming the amplified oscillating signal to generate a transformed signal; blocking a negative voltage of the transformed signal to generate a test signal to be transmitted to the electronic component; and detecting electrical characteristics of the electronic component to generate result data.
公开/授权文献
- US20080157788A1 SYSTEM AND METHOD FOR TESTING VOLTAGE ENDURANCE 公开/授权日：2008-07-03
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