发明授权
- 专利标题: Component measuring device
- 专利标题(中): 元件测量装置
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申请号: US10557782申请日: 2004-05-21
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公开(公告)号: US07586610B2公开(公告)日: 2009-09-08
- 发明人: Yasushi Nagasawa
- 申请人: Yasushi Nagasawa
- 申请人地址: JP Shibuya-Ku, Tokyo
- 专利权人: Terumo Kabushiki Kaisha
- 当前专利权人: Terumo Kabushiki Kaisha
- 当前专利权人地址: JP Shibuya-Ku, Tokyo
- 代理机构: Buchanan Ingersoll & Rooney PC
- 优先权: JP2003-144131 20030521; JP2003-201933 20030725; JP2003-328879 20030919
- 国际申请: PCT/JP2004/007305 WO 20040521
- 国际公布: WO2004/111622 WO 20041223
- 主分类号: G01N21/25
- IPC分类号: G01N21/25
摘要:
A component measuring device for measuring the quantity and/or the property of a given component in a specimen by calorimetrically measuring a test strip includes a tip mount on which is to be mounted a tip having the test strip, and a photometric unit. The photometric unit comprises a light-emitting element that applies light to the test strip while the tip is mounted on the tip mount, a light-detecting element that detects light reflected from the test strip, and a holder in which is held the light-emitting element and the light-detecting element. The holder possesses a passage through which passes the light and the reflected light. A light-transmissive member closes the passage with a sealing member interposed therebetween in a portion of the holder which faces the test strip. The component measuring device can also be provided with a stain detecting device which is adapted to detect a stain on the light-transmissive member.
公开/授权文献
- US20060243031A1 Component measuring device 公开/授权日:2006-11-02
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