Invention Grant
- Patent Title: Nonvolatile memory device and related method of operation
- Patent Title (中): 非易失存储器件及相关操作方法
-
Application No.: US11850130Application Date: 2007-09-05
-
Publication No.: US07586775B2Publication Date: 2009-09-08
- Inventor: Sang-beom Kang , Yong-jin Yoon , Qi Wang
- Applicant: Sang-beom Kang , Yong-jin Yoon , Qi Wang
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2006-0085680 20060906
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A nonvolatile memory device comprises a first voltage generation unit, a second voltage generation unit, a first circuit block, and a discharge unit. The first voltage generation unit generates a first voltage with a first magnitude. The second voltage generation unit generates a second voltage with a second magnitude greater than the first magnitude. The first circuit block selectively receives the first voltage or the second voltage through an input node. The discharge unit discharges the input node between a time point where the input node has been charged with the second voltage and a time point where the input node receives the first voltage.
Public/Granted literature
- US20080055964A1 NONVOLATILE MEMORY DEVICE AND RELATED METHOD OF OPERATION Public/Granted day:2008-03-06
Information query