发明授权
- 专利标题: Method of temperature measurement and temperature-measuring device using the same
- 专利标题(中): 温度测量方法及使用其的温度测量装置
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申请号: US11836693申请日: 2007-08-09
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公开(公告)号: US07591586B2公开(公告)日: 2009-09-22
- 发明人: Akira Ohnishi
- 申请人: Akira Ohnishi
- 申请人地址: JP Tokyo
- 专利权人: Japan Aerospace Exploration Agency
- 当前专利权人: Japan Aerospace Exploration Agency
- 当前专利权人地址: JP Tokyo
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 优先权: JP2006-219895 20060811
- 主分类号: G01J5/00
- IPC分类号: G01J5/00
摘要:
A method of precisely measuring temperature of an object without having to setting the emissivity of the object over a wide temperature range from low to high temperature with a single radiation thermometer. The temperature-measuring device of the present invention includes a reference object having an emissivity of substantially 1 in a prescribed wavelength range; a bandpass filter transmitting radiant energy in the prescribed wavelength range; and a radiation thermometer for observing temperature by taking in the radiant energy transmitted through the bandpass filter. The device has a structure for measuring temperature of an object by bringing the reference object into contact with the object, observing temperature radiated from the reference object after the temperature of the reference object has become substantially in the thermal equilibrium with the object and transmitted through the bandpass filter using the radiation thermometer, and determining the object temperature based on the observed temperature.