发明授权
- 专利标题: System and method for reducing heat dissipation during burn-in
- 专利标题(中): 老化过程中减少散热的系统和方法
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申请号: US11827290申请日: 2007-07-10
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公开(公告)号: US07595652B2公开(公告)日: 2009-09-29
- 发明人: Eric Chen-Li Sheng , David H. Hoffman , John Laurence Niven
- 申请人: Eric Chen-Li Sheng , David H. Hoffman , John Laurence Niven
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
A plurality of devices under test are each subject to a body bias voltage during burn-in testing. The body bias voltage reduces leakage current associated with the devices under test. A test controller can access a store of information including leakage current as a function of body bias voltage and can select a body bias voltage that corresponds to the minimum leakage current in the store of information. A voltage supply coupled to the test controller can provide the body bias voltage corresponding to the minimum leakage current to the devices under test during the burn-in testing.