发明授权
- 专利标题： Method and apparatus for detecting structural elements of subjects
- 专利标题（中）： 检测科目结构要素的方法和装置
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申请号： US11200148申请日： 2005-08-10
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公开(公告)号： US07599519B2公开(公告)日： 2009-10-06
- 发明人: Kouji Yokouchi , Sadato Akahori , Kensuke Terakawa
- 申请人： Kouji Yokouchi , Sadato Akahori , Kensuke Terakawa
- 申请人地址： JP Tokyo
- 专利权人： FUJIFILM Corporation
- 当前专利权人： FUJIFILM Corporation
- 当前专利权人地址： JP Tokyo
- 代理机构： Sughrue Mion, PLLC
- 优先权： JP2004-234473 20040811; JP2004-234474 20040811; JP2005-069530 20050311; JP2005-222611 20050801
- 主分类号： G06K9/00
- IPC分类号： G06K9/00 ; H04N5/222
摘要：
Structural element candidates, estimated to be predetermined structural elements of a predetermined subject, are detected from an image that includes the subject. The subject that includes the structural element candidates is detected from the image in the vicinity of the detected structural element candidates. The characteristics of the structural elements are discriminated from the image in the vicinity of the structural element candidates, at a higher accuracy than when the structural elements were detected. In the case that the characteristics of the structural elements are discriminated, the structural element candidates are confirmed as being the predetermined structural elements.
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