发明授权
- 专利标题: Word line compensation in non-volatile memory erase operations
- 专利标题(中): 非易失性存储器擦除操作中的字线补偿
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申请号: US12242831申请日: 2008-09-30
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公开(公告)号: US07606074B2公开(公告)日: 2009-10-20
- 发明人: Jun Wan , Jeffrey W Lutze , Chan-Sui Pang
- 申请人: Jun Wan , Jeffrey W Lutze , Chan-Sui Pang
- 申请人地址: US CA Milpitas
- 专利权人: SanDisk Corporation
- 当前专利权人: SanDisk Corporation
- 当前专利权人地址: US CA Milpitas
- 代理机构: Vierra Magen Marcus & DeNiro LLP
- 主分类号: G11C11/34
- IPC分类号: G11C11/34
摘要:
Compensation voltage(s) are applied to a non-volatile memory system during erase operations to equalize the erase behavior of memory cells. Compensation voltages can compensate for voltages capacitively coupled to memory cells of a NAND string from other memory cells and/or select gates. A compensation voltage can be applied to one or more memory cells to substantially normalize the erase behavior of the memory cells. A compensation voltage can be applied to end memory cells of a NAND string to equalize their erase behavior with interior memory cells of the NAND string. A compensation voltage can also be applied to interior memory cells to equalize their erase behavior with end memory cells. Additionally, a compensation voltage can be applied to one or more select gates of a NAND string to compensate for voltages coupled to one or more memory cells from the select gate(s). Various compensation voltages can be used.
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