利索-全球专利检索

  1. 登录
  2. 注册
发明授权
US07608516B2 Semiconductor pixel arrays with reduced sensitivity to defects 有权
半导体像素阵列具有降低的缺陷敏感性

Semiconductor pixel arrays with reduced sensitivity to defects
摘要：
A pixel structure is described, comprising at least two selection switches coupled in series to improve the yield of the pixel. Also an array comprising such pixel structures logically organized in rows and columns is described, as well as a method for selecting a row or column of pixel structures in such an array.
摘要（中）：

描述了像素结构，其包括串联耦合的至少两个选择开关以提高像素的产量。 还描述了包括以行和列逻辑地组织的这种像素结构的阵列，以及用于在这样的阵列中选择像素结构的行或列的方法。

公开/授权文献
信息查询
Espacenet
0/0