发明授权
- 专利标题： System and method for estimation of integrated circuit signal characteristics using optical measurements
- 专利标题（中）： 使用光学测量估计集成电路信号特性的系统和方法
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申请号： US12115658申请日： 2008-05-06
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公开(公告)号： US07612571B2公开(公告)日： 2009-11-03
- 发明人: Franco Stellari , Alberto Tosi , Peilin Song
- 申请人： Franco Stellari , Alberto Tosi , Peilin Song
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Keusey, Tutunjian & Bitetto, P.C.
- 代理商 Anne V. Dougherty, Esq.
- 主分类号： G01R31/00
- IPC分类号： G01R31/00
摘要：
Systems and methods for making electrical measurements using optical emissions include positioning a sensor/photodetector to measure radiation emissions from devices to be tested. Radiation emission information is collected from the device to be tested during electrical operation. Characteristic features of the radiation emission information are determined, and differences between the characteristic features are deciphered. Based on the differences, models are employed to determine electrical properties of the device, especially operational characteristics.
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