发明授权
- 专利标题： Geometric measurement system and method of measuring a geometric characteristic of an object
- 专利标题（中）： 几何测量系统和测量对象几何特征的方法
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申请号： US11783316申请日： 2007-04-09
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公开(公告)号： US07616330B2公开(公告)日： 2009-11-10
- 发明人: Daniel R. Neal , Thomas Daniel Raymond , William Shea Powers
- 申请人： Daniel R. Neal , Thomas Daniel Raymond , William Shea Powers
- 申请人地址： US CA Santa Ana
- 专利权人： AMO Wavefront Sciences, LLP
- 当前专利权人： AMO Wavefront Sciences, LLP
- 当前专利权人地址： US CA Santa Ana
- 主分类号： G01B11/14
- IPC分类号： G01B11/14 ; G01B11/24
摘要：
A geometric measurement system is adapted to precisely measure one or more surfaces of objects such as corneas, molds, contact lenses in molds, contact lenses, or other objects in a fixture. The geometric measurement system can employ one or more of three possible methods of measurement: Shack-Hartmann wavefront sensing with wavefront stitching; phase diversity sensing; and white light interferometry.
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