发明授权
- 专利标题: Method of detecting occurrence of error event in data and apparatus for the same
- 专利标题(中): 检测数据和装置中错误事件发生的方法
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申请号: US11224351申请日: 2005-09-13
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公开(公告)号: US07620879B2公开(公告)日: 2009-11-17
- 发明人: Jihoon Park , Jaekyun Moon , Jun Lee
- 申请人: Jihoon Park , Jaekyun Moon , Jun Lee
- 申请人地址: KR Suwon-si US MN Minneapolis
- 专利权人: Samsung Electronics Co., Ltd.,University of Minnesota
- 当前专利权人: Samsung Electronics Co., Ltd.,University of Minnesota
- 当前专利权人地址: KR Suwon-si US MN Minneapolis
- 代理机构: Sughrue Mion, PLLC
- 主分类号: H03M13/00
- IPC分类号: H03M13/00
摘要:
A method of detecting an occurrence of an error event in data and an apparatus for the same are provided. The method includes: preparing an error detection code wherein syndrome sequences for dominant error events are all different; generating a codeword from source data using the error detection code; detecting the occurrence of the dominant error event in the codeword by checking a syndrome computed from the codeword; and determining a type and likely error starting positions of the occurred dominant error event using the syndrome sequences correspond to the syndrome.
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