发明授权
US07622962B2 Sense amplifier control signal generating circuit of semiconductor memory apparatus
失效
半导体存储装置的感应放大器控制信号发生电路
- 专利标题: Sense amplifier control signal generating circuit of semiconductor memory apparatus
- 专利标题(中): 半导体存储装置的感应放大器控制信号发生电路
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申请号: US11826924申请日: 2007-07-19
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公开(公告)号: US07622962B2公开(公告)日: 2009-11-24
- 发明人: Dae-Suk Kim , Jong Chern Lee
- 申请人: Dae-Suk Kim , Jong Chern Lee
- 申请人地址: KR Gyeonggi-do
- 专利权人: Hynix Semiconductor Inc.
- 当前专利权人: Hynix Semiconductor Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Venable LLP
- 代理商 Jeffri A. Kaminski
- 优先权: KR10-2006-0123585 20061207
- 主分类号: G01R19/00
- IPC分类号: G01R19/00
摘要:
A sense amplifier control signal generating circuit of a semiconductor memory apparatus is provided. The sense amplifier control signal generating circuit includes a timing control unit that models a transmission path of data from a memory cell to a sense amplifier through a bit line and generates a timing control signal at a sensing timing when the sense amplifier starts a sensing operation. A sense amplifier control signal generating unit receives the timing control signal and generates a sense amplifier control signal.
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