发明授权
US07622962B2 Sense amplifier control signal generating circuit of semiconductor memory apparatus 失效
半导体存储装置的感应放大器控制信号发生电路

  • 专利标题: Sense amplifier control signal generating circuit of semiconductor memory apparatus
  • 专利标题(中): 半导体存储装置的感应放大器控制信号发生电路
  • 申请号: US11826924
    申请日: 2007-07-19
  • 公开(公告)号: US07622962B2
    公开(公告)日: 2009-11-24
  • 发明人: Dae-Suk KimJong Chern Lee
  • 申请人: Dae-Suk KimJong Chern Lee
  • 申请人地址: KR Gyeonggi-do
  • 专利权人: Hynix Semiconductor Inc.
  • 当前专利权人: Hynix Semiconductor Inc.
  • 当前专利权人地址: KR Gyeonggi-do
  • 代理机构: Venable LLP
  • 代理商 Jeffri A. Kaminski
  • 优先权: KR10-2006-0123585 20061207
  • 主分类号: G01R19/00
  • IPC分类号: G01R19/00
Sense amplifier control signal generating circuit of semiconductor memory apparatus
摘要:
A sense amplifier control signal generating circuit of a semiconductor memory apparatus is provided. The sense amplifier control signal generating circuit includes a timing control unit that models a transmission path of data from a memory cell to a sense amplifier through a bit line and generates a timing control signal at a sensing timing when the sense amplifier starts a sensing operation. A sense amplifier control signal generating unit receives the timing control signal and generates a sense amplifier control signal.
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