发明授权
- 专利标题: Multiple-frequency ultrasonic test probe, inspection system, and inspection method
- 专利标题(中): 多频超声波探头,检查系统和检查方法
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申请号: US11759105申请日: 2007-06-06
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公开(公告)号: US07628075B2公开(公告)日: 2009-12-08
- 发明人: James C. Kennedy , Barry A. Fetzer , Jeffry J. Garvey , Mark L. Little
- 申请人: James C. Kennedy , Barry A. Fetzer , Jeffry J. Garvey , Mark L. Little
- 申请人地址: US IL Chicago
- 专利权人: The Boeing Company
- 当前专利权人: The Boeing Company
- 当前专利权人地址: US IL Chicago
- 代理机构: Yee & Associates, P.C.
- 代理商 Dennis R. Plank
- 主分类号: G01N29/24
- IPC分类号: G01N29/24 ; G01N29/28
摘要:
Improved apparatus, systems, and methods for inspecting a structure are provided that use a probe having two ultrasonic transducer arrays. This enables simultaneous testing using two different test frequencies. The probe uses pulse echo ultrasonic signals at different frequencies to inspect the structure. The probe includes a support body having a fluid conduit formed therein. The fluid conduit provides flow paths for a couplant (such as water) that is used to couple the ultrasonic signals between the structure under test and the arrays. The fluid conduit is configured to quickly eject couplant and bubbles contained in the couplant.
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