发明授权
US07633456B2 Wafer scanning antenna with integrated tunable dielectric phase shifters 有权
具有集成可调介质移相器的晶圆扫描天线

  • 专利标题: Wafer scanning antenna with integrated tunable dielectric phase shifters
  • 专利标题(中): 具有集成可调介质移相器的晶圆扫描天线
  • 申请号: US11754735
    申请日: 2007-05-29
  • 公开(公告)号: US07633456B2
    公开(公告)日: 2009-12-15
  • 发明人: Robert A. York
  • 申请人: Robert A. York
  • 申请人地址: US CA Goleta
  • 专利权人: Agile RF, Inc.
  • 当前专利权人: Agile RF, Inc.
  • 当前专利权人地址: US CA Goleta
  • 代理机构: Fenwick & West LLP
  • 主分类号: H01Q21/00
  • IPC分类号: H01Q21/00
Wafer scanning antenna with integrated tunable dielectric phase shifters
摘要:
A wafer antenna comprises a wafer substrate, a plurality of antenna elements integrated on the wafer substrate for radiating and receiving a radio frequency signal, an electrical connection integrated on the wafer substrate; a feed network integrated on the wafer substrate for distributing the RF signal from the electrical connection to the antenna elements and from the antenna elements to the electrical connection, and a plurality of tunable dielectric phase shifters integrated on the wafer substrate with each of the tunable dielectric phase shifters coupled to a corresponding one of the antenna elements and controlling the phase of the RF signal coupled to the corresponding one of the antenna elements.
信息查询
0/0