发明授权
US07633456B2 Wafer scanning antenna with integrated tunable dielectric phase shifters
有权
具有集成可调介质移相器的晶圆扫描天线
- 专利标题: Wafer scanning antenna with integrated tunable dielectric phase shifters
- 专利标题(中): 具有集成可调介质移相器的晶圆扫描天线
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申请号: US11754735申请日: 2007-05-29
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公开(公告)号: US07633456B2公开(公告)日: 2009-12-15
- 发明人: Robert A. York
- 申请人: Robert A. York
- 申请人地址: US CA Goleta
- 专利权人: Agile RF, Inc.
- 当前专利权人: Agile RF, Inc.
- 当前专利权人地址: US CA Goleta
- 代理机构: Fenwick & West LLP
- 主分类号: H01Q21/00
- IPC分类号: H01Q21/00
摘要:
A wafer antenna comprises a wafer substrate, a plurality of antenna elements integrated on the wafer substrate for radiating and receiving a radio frequency signal, an electrical connection integrated on the wafer substrate; a feed network integrated on the wafer substrate for distributing the RF signal from the electrical connection to the antenna elements and from the antenna elements to the electrical connection, and a plurality of tunable dielectric phase shifters integrated on the wafer substrate with each of the tunable dielectric phase shifters coupled to a corresponding one of the antenna elements and controlling the phase of the RF signal coupled to the corresponding one of the antenna elements.
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