发明授权
- 专利标题: Method and apparatus for inspecting optical disc
- 专利标题(中): 检查光盘的方法和装置
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申请号: US11594183申请日: 2006-11-08
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公开(公告)号: US07636285B2公开(公告)日: 2009-12-22
- 发明人: Kazunori Tokiwa
- 申请人: Kazunori Tokiwa
- 申请人地址: JP Yokohama
- 专利权人: Victor Company of Japan, Ltd.
- 当前专利权人: Victor Company of Japan, Ltd.
- 当前专利权人地址: JP Yokohama
- 代理商 Louis Woo
- 优先权: JP2005-351636 20051206; JP2006-003750 20060111; JP2006-117663 20060421
- 主分类号: G11B7/00
- IPC分类号: G11B7/00
摘要:
Reflected light caused by reflection of a laser beam at a first layer of an optical disc is converted into a main signal. Reflected light caused by reflection of the laser beam at a second layer of the optical disc is converted into a sub signal. An address of a currently-accessed position in the first layer is detected from the main signal. A reference address in the first layer corresponds to a boundary between a signal recorded area and a signal unrecorded area in the second layer. A specified address in the first layer corresponds to a position radially separated from the position at the reference address by an allowable range. A misalignment between tracks on the first and second layers is concluded to be within the allowable range in cases where the sub signal substantially takes a reference level when the detected address reaches the specified address.
公开/授权文献
- US20070127339A1 Method and apparatus for inspecting optical disc 公开/授权日:2007-06-07
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