发明授权
US07636285B2 Method and apparatus for inspecting optical disc 有权
检查光盘的方法和装置

  • 专利标题: Method and apparatus for inspecting optical disc
  • 专利标题(中): 检查光盘的方法和装置
  • 申请号: US11594183
    申请日: 2006-11-08
  • 公开(公告)号: US07636285B2
    公开(公告)日: 2009-12-22
  • 发明人: Kazunori Tokiwa
  • 申请人: Kazunori Tokiwa
  • 申请人地址: JP Yokohama
  • 专利权人: Victor Company of Japan, Ltd.
  • 当前专利权人: Victor Company of Japan, Ltd.
  • 当前专利权人地址: JP Yokohama
  • 代理商 Louis Woo
  • 优先权: JP2005-351636 20051206; JP2006-003750 20060111; JP2006-117663 20060421
  • 主分类号: G11B7/00
  • IPC分类号: G11B7/00
Method and apparatus for inspecting optical disc
摘要:
Reflected light caused by reflection of a laser beam at a first layer of an optical disc is converted into a main signal. Reflected light caused by reflection of the laser beam at a second layer of the optical disc is converted into a sub signal. An address of a currently-accessed position in the first layer is detected from the main signal. A reference address in the first layer corresponds to a boundary between a signal recorded area and a signal unrecorded area in the second layer. A specified address in the first layer corresponds to a position radially separated from the position at the reference address by an allowable range. A misalignment between tracks on the first and second layers is concluded to be within the allowable range in cases where the sub signal substantially takes a reference level when the detected address reaches the specified address.
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