Invention Grant
- Patent Title: Calibration for automated microassembly
- Patent Title (中): 校准自动微组装
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Application No.: US11464423Application Date: 2006-08-14
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Publication No.: US07637142B2Publication Date: 2009-12-29
- Inventor: Kenneth Tsui , Aaron Geisberger
- Applicant: Kenneth Tsui , Aaron Geisberger
- Applicant Address: US TX Richardson
- Assignee: Zyvex Labs
- Current Assignee: Zyvex Labs
- Current Assignee Address: US TX Richardson
- Agency: Haynes and Boone LLP
- Main IPC: G01B3/30
- IPC: G01B3/30

Abstract:
An apparatus including a micro-mechanical calibration member having at least a portion that is elastically biasable away from a neutral position in response to mechanical contact. The apparatus may also include a fixed member proximate the micro-mechanical calibration member which may be referenced to automatically detect deflection of the micro-mechanical calibration member away from the neutral position. The micro-mechanical calibration member may also be configured to receive a micro-mechanical contacting member to provide the mechanical contact employed to bias the micro-mechanical calibration member away from the neutral position.
Public/Granted literature
- US20070012084A1 Calibration for Automated Microassembly Public/Granted day:2007-01-18
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