发明授权
US07637658B2 Systems and methods for PWM clocking in a temperature measurement circuit
有权
温度测量电路中PWM时钟的系统和方法
- 专利标题: Systems and methods for PWM clocking in a temperature measurement circuit
- 专利标题(中): 温度测量电路中PWM时钟的系统和方法
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申请号: US11738571申请日: 2007-04-23
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公开(公告)号: US07637658B2公开(公告)日: 2009-12-29
- 发明人: Marco A. Gardner , Jerry L. Doorenbos
- 申请人: Marco A. Gardner , Jerry L. Doorenbos
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 John J. Patti; Wade J. Brady, III; Frederick J. Telecky, Jr.
- 主分类号: G01K7/00
- IPC分类号: G01K7/00
摘要:
Various systems and methods for pulse width modulated clocking in a temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems with a variable current source, a transistor, and a pulse width modulation circuit. The variable current source is operable to provide a first current and a second current that are applied to the transistor. A first base-emitter voltage occurs on the transistor when the first current is applied, and a second base-emitter voltage occurs on the transistor when the second current is applied. The first base emitter voltage is associated with a first sample period, and a second base-emitter voltage is associated with a second sample period. The pulse width modulation circuit provides a pulse width modulated clock including a combination of the aforementioned first period and second period.
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