Invention Grant
- Patent Title: Apparatus and method for analyzing component using microscopic regions
- Patent Title (中): 使用微观区域分析组件的装置和方法
-
Application No.: US11145177Application Date: 2005-06-06
-
Publication No.: US07639850B2Publication Date: 2009-12-29
- Inventor: Sang-Joon Han
- Applicant: Sang-Joon Han
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: Staas & Halsey LLP
- Priority: KR10-2004-0084874 20041022
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An apparatus for and a method of analyzing components using microscopic regions. The apparatus includes: an image obtainer obtaining an image of a part of a living body; a color information generator generating color information of an image having a matrix pattern from a size of the microscopic regions and the obtained image; a first data transformer transforming the color information of the image into a product of first and second matrixes; and a component analyzer analyzing components of the obtained image using at least one of the first and second matrixes. When the obtained image is divided into a plurality of microscopic regions, the size of the microscopic regions is determined so that concentrations of components of the part fluctuate in each of the microscopic regions.
Public/Granted literature
- US20060088197A1 Apparatus and method for analyzing component using microscopic regions Public/Granted day:2006-04-27
Information query