发明授权
- 专利标题: Systems and methods for detecting flaws on a storage disk
- 专利标题(中): 用于检测存储磁盘上的缺陷的系统和方法
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申请号: US11484893申请日: 2006-07-10
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公开(公告)号: US07646556B1公开(公告)日: 2010-01-12
- 发明人: K. Rickmer E. Kose , Bin Liu
- 申请人: K. Rickmer E. Kose , Bin Liu
- 申请人地址: US CA Scotts Valley
- 专利权人: Seagate Technology LLC
- 当前专利权人: Seagate Technology LLC
- 当前专利权人地址: US CA Scotts Valley
- 代理机构: Westman, Champlin & Kelly, P.A.
- 主分类号: G11B5/40
- IPC分类号: G11B5/40
摘要:
A flaw scan system for detecting a location of first and second types of location specific anomalies on a storage disk of a hard disk drive comprising a write system, a read system, and first and second anomaly location systems. The write system writes a first set of bits to the storage disk in first and second data patterns. The read system reads the first set of bits from the storage disk. The first anomaly location system determines locations of the first type of location specific anomaly based on the first data pattern. The second anomaly location system determines locations of the second type of location specific anomaly based on the second data pattern.
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