发明授权
- 专利标题: Nonvolatile semiconductor memory device
- 专利标题(中): 非易失性半导体存储器件
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申请号: US12032206申请日: 2008-02-15
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公开(公告)号: US07646646B2公开(公告)日: 2010-01-12
- 发明人: Yoshikazu Hosomura , Takuya Futatsuyama
- 申请人: Yoshikazu Hosomura , Takuya Futatsuyama
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2007-035159 20070215
- 主分类号: G11C16/06
- IPC分类号: G11C16/06 ; G11C16/04
摘要:
According to one embodiment, a nonvolatile semiconductor memory device includes: a memory cell array having: a cell string including a plurality of memory cells connected in series; a plurality of word lines respectively connected to the plurality of memory cells; a source side selecting gate connected to one end of the cell string; and a drain side selecting gate connected to the other end of the cell string; a word line selector that selects one of the word lines connected to a target memory cell to be written; and an equalizing unit that equalizes voltages of the plurality of word lines after data write of the target memory cell is finished.
公开/授权文献
- US20080198667A1 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE 公开/授权日:2008-08-21
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