Invention Grant
- Patent Title: Scanning probe with constant scanning speed
- Patent Title (中): 以恒定扫描速度扫描探头
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Application No.: US12053164Application Date: 2008-03-21
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Publication No.: US07647706B2Publication Date: 2010-01-19
- Inventor: Pascal Jordil , Siercks Knut , Bo Pettersson , William Wilcox
- Applicant: Pascal Jordil , Siercks Knut , Bo Pettersson , William Wilcox
- Applicant Address: SE Nacka Strand
- Assignee: Hexagon Metrology AB
- Current Assignee: Hexagon Metrology AB
- Current Assignee Address: SE Nacka Strand
- Agency: Pearne & Gordon LLP
- Priority: EP07106415 20070418
- Main IPC: G01B5/008
- IPC: G01B5/008

Abstract:
A method for scanning a surface of a workpiece 1 at a constant scanning speed /va/ using a scanning probe 2 mounted on a support 3 on a coordinate measuring machine (CMM) 4. The CMM contains a first set of drive means (6, 7, 8) to move the support according to three linear axis (x,y,z), and the support 3 contains a second set of drive means (14, 17) for actuating the movement of the scanning probe 2 with two degrees of freedom relative to said support 3. The method involves control means 33 coupled to the sets of drive means (6, 14, 17), and memory means for storing theoretical profiles and coordinates of the surface to scan.
Public/Granted literature
- US20080257023A1 SCANNING PROBE WITH CONSTANT SCANNING SPEED Public/Granted day:2008-10-23
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