Invention Grant
- Patent Title: Laser analytical instrument, laser analytical method, and gas leak inspection instrument
- Patent Title (中): 激光分析仪,激光分析仪,气体泄漏检测仪
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Application No.: US11632377Application Date: 2005-07-13
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Publication No.: US07663122B2Publication Date: 2010-02-16
- Inventor: Ryugo Hayano , Masaki Hori
- Applicant: Ryugo Hayano , Masaki Hori
- Applicant Address: JP Tokyo JP Tokyo JP Tokyo
- Assignee: Ryugo Hayano,Masaki Hori,Honda Motor Co., Ltd.
- Current Assignee: Ryugo Hayano,Masaki Hori,Honda Motor Co., Ltd.
- Current Assignee Address: JP Tokyo JP Tokyo JP Tokyo
- Agency: Lahive & Cockfield, LLP
- Agent Anthony A. Laurentano
- Priority: JP2004-207794 20040714
- International Application: PCT/JP2005/012942 WO 20050713
- International Announcement: WO2006/006628 WO 20060119
- Main IPC: G01J1/58
- IPC: G01J1/58

Abstract:
Laser light generated from laser light generating means (10) is fed through laser light transfer means (11) including a demagnification optical system (23) so as to be condensed in a part Ex where an object gas of analysis exists. The laser light is imparted with energy for causing a multiple photon excitation phenomenon or a multiple photon ionization phenomenon of gas in the condensed part Ex. The energy of the laser light is large enough for 17 eV or higher energy to be injected into a hydrogen molecule when the object gas of analysis is hydrogen and for 23 eV or higher energy to be injected into a helium atom when the object gas of analysis is helium. For example, the intensity of the laser light in the condensed part Ex is 1014 W/cm2 or higher. This provides a laser analytical instrument capable of observing various types of gas through an inexpensive and simple arrangement.
Public/Granted literature
- US20080121814A1 Laser Analytical Instrument, Laser Analytical Method, and Gas Leak Inspection Instrument Public/Granted day:2008-05-29
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