Invention Grant
- Patent Title: Memory system including a resistance variable memory device
- Patent Title (中): 存储器系统包括电阻变量存储器件
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Application No.: US12124523Application Date: 2008-05-21
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Publication No.: US07668007B2Publication Date: 2010-02-23
- Inventor: Byung-Gil Choi , Woo-Yeong Cho , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
- Applicant: Byung-Gil Choi , Woo-Yeong Cho , Du-Eung Kim , Hyung-Rok Oh , Beak-Hyung Cho , Yu-Hwan Ro
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR2005-115629 20051130; KR2005-127038 20051221
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A memory system includes a resistance variable memory device, and a memory controller for controlling the resistance variable memory device. The resistance variable memory device includes a memory cell connected to a bitline, a high voltage circuit adapted to generate a high voltage from an externally provided power source voltage, where the high voltage is higher than the power source voltage, a precharging circuit adapted to charge the bitline to the power source voltage and further charge the bitline to the high voltage, a bias circuit adapted to provide a read current to the bitline with using the high voltage, and a sense amplifier adapted to detect a voltage level of the bitline with using the high voltage.
Public/Granted literature
- US20080232161A1 RESISTANCE VARIABLE MEMORY DEVICE AND READ METHOD THEREOF Public/Granted day:2008-09-25
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