Invention Grant
- Patent Title: Method for measuring luminescence at a luminescence detection workstation
- Patent Title (中): 用于在发光检测工作站测量发光的方法
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Application No.: US11251873Application Date: 2005-10-18
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Publication No.: US07670848B2Publication Date: 2010-03-02
- Inventor: Michael R. Gambini , John C. Voyta , John Atwood , Bruce E. DeSimas, II , Edward Lakatos , Jeff Levi , Israel Metal , George Sabak , Yongdong Wang
- Applicant: Michael R. Gambini , John C. Voyta , John Atwood , Susan A. Atwood-Stone, legal representative , Bruce E. DeSimas, II , Edward Lakatos , Jeff Levi , Israel Metal , George Sabak , Yongdong Wang
- Applicant Address: US CA Carlsbad
- Assignee: Applied Biosystems, LLC
- Current Assignee: Applied Biosystems, LLC
- Current Assignee Address: US CA Carlsbad
- Main IPC: G01N21/76
- IPC: G01N21/76 ; G01T1/10

Abstract:
In a luminescence detecting apparatus and method for analyzing luminescent samples, luminescent samples are placed in a plurality of sample wells in a tray, and the tray is placed in a visible-light impervious chamber containing a charge coupled device camera. In the chamber, light from the luminescent samples pass through a collimator, a Fresnel field lens, an infrared filter, and a camera lens, whereupon a focused image is created by the optics on the camera. The use of an infrared filter suppresses stray IR radiation resulting from plate phosphorescence (which can result in abnormally high backgrounds and/or alteration of the image received by the camera).
Public/Granted literature
- US20060088444A1 Luminescence detection workstation Public/Granted day:2006-04-27
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