Invention Grant
US07672155B2 Resistive memory devices including selected reference memory cells
失效
电阻式存储器件包括所选择的参考存储单元
- Patent Title: Resistive memory devices including selected reference memory cells
- Patent Title (中): 电阻式存储器件包括所选择的参考存储单元
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Application No.: US12265941Application Date: 2008-11-06
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Publication No.: US07672155B2Publication Date: 2010-03-02
- Inventor: Hyun-Jo Kim , Kyung-Tae Nam , In-Gyu Baek , Se-Chung Oh , Jang-Eun Lee , Jun-Ho Jeong
- Applicant: Hyun-Jo Kim , Kyung-Tae Nam , In-Gyu Baek , Se-Chung Oh , Jang-Eun Lee , Jun-Ho Jeong
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR2005-0107178 20051109
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A magnetic memory cell array device can include a first current source line extending between pluralities of first and second memory cells configured for respective simultaneous programming and configured to conduct adequate programming current for writing one of the pluralities of first and second memory cells, a first current source transistor coupled to the first current source line and to a word line, a programming conductor coupled to the first current source transistor and extending across bit lines coupled to the one of the pluralities of first and second memory cells, configured to conduct the programming current across the bit lines, a second current source transistor coupled to the programming conductor and configured to switch the programming current from the programming conductor to a second current source transistor output, a second current source line extending adjacent the one of the pluralities of first and second memory cells opposite the first current source line, a first bias circuit configured to apply a first bias voltage to the first or second memory cells selected for accessed during a read operation, and a second bias circuit configured to apply a second bias voltage to the first or second memory cells unselected for access during the read operation.
Public/Granted literature
- US20090067216A1 RESISTIVE MEMORY DEVICES INCLUDING SELECTED REFERENCE MEMORY CELLS Public/Granted day:2009-03-12
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