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US07679088B2 Thin-film transistor and fabrication method thereof 有权
薄膜晶体管及其制造方法

  • 专利标题: Thin-film transistor and fabrication method thereof
  • 专利标题(中): 薄膜晶体管及其制造方法
  • 申请号: US12146479
    申请日: 2008-06-26
  • 公开(公告)号: US07679088B2
    公开(公告)日: 2010-03-16
  • 发明人: Han-Tu Lin
  • 申请人: Han-Tu Lin
  • 申请人地址: TW Hsin-Chu
  • 专利权人: AU Optronics Corp.
  • 当前专利权人: AU Optronics Corp.
  • 当前专利权人地址: TW Hsin-Chu
  • 代理商 Winston Hsu
  • 优先权: TW95117648A 20060518
  • 主分类号: H01L29/04
  • IPC分类号: H01L29/04 H01L31/036
Thin-film transistor and fabrication method thereof
摘要:
A fabrication method of a TFT includes successively forming four thin films containing a first conductive layer, an insulation layer, a semiconductor layer, and a second conductive layer on a substrate, performing a first PEP process to pattern the four thin films for forming a semiconductor island and a gate electrode with the semiconductor layer and the first conductive layer respectively. Then, a laser ablation process is performed to define a channel pattern in the four thin films and remove a portion of the second conductive layer so that unconnected source electrode and drain electrode are formed with the second conductive layer.
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