Invention Grant
- Patent Title: Stokes parameter measurement device and method
- Patent Title (中): 斯托克斯参数测量装置及方法
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Application No.: US11987714Application Date: 2007-12-04
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Publication No.: US07679744B2Publication Date: 2010-03-16
- Inventor: Mieko Yamagaki , Yu Mimura , Kazuyou Mizuno , Takeshi Takagi
- Applicant: Mieko Yamagaki , Yu Mimura , Kazuyou Mizuno , Takeshi Takagi
- Applicant Address: JP Tokyo
- Assignee: The Furukawa Electric Co., Ltd.
- Current Assignee: The Furukawa Electric Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2002-008330 20020117; JP2002-201268 20020710
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
The invention provides a Stokes parameter measurement device and Stokes parameter measurement method that enable high-precision measurement. The Stokes parameter measurement device comprises a polarization splitting device which comprises an optical element formed of a birefringent crystal material and which, by means of the optical element, splits signal light to be measured into a plurality of polarized light beams and adjusts the polarization state of one or more among the plurality of polarized light beams, and a light-receiving portion for performing photoelectric conversion of an optical component of the signal light split by and emitted from the polarization splitting device.
Public/Granted literature
- US20090273784A1 Stokes parameter measurement device and method Public/Granted day:2009-11-05
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