发明授权
- 专利标题: Method of impurity introduction, impurity introduction apparatus and semiconductor device produced with use of the method
- 专利标题(中): 杂质导入方法,杂质导入装置以及利用该方法制造的半导体装置
-
申请号: US10599205申请日: 2005-03-17
-
公开(公告)号: US07682954B2公开(公告)日: 2010-03-23
- 发明人: Yuichiro Sasaki , Ichiro Nakayama , Bunji Mizuno
- 申请人: Yuichiro Sasaki , Ichiro Nakayama , Bunji Mizuno
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Pearne & Gordon LLP
- 优先权: JP2004-090455 20040325
- 国际申请: PCT/JP2005/004790 WO 20050317
- 国际公布: WO2005/093800 WO 20051006
- 主分类号: H01L21/425
- IPC分类号: H01L21/425
摘要:
An impurity region having a box-shaped impurity profile is formed.An impurity introducing method includes a step of introducing a desired impurity into a surface of a solid base body, and a step of radiating plasma to a surface of the solid base body after the impurity introducing step thus forming an impurity profile having an approximately box-shape.
公开/授权文献
信息查询
IPC分类: