发明授权
- 专利标题: Enhanced permeability device structures and method
- 专利标题(中): 增强渗透性装置结构和方法
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申请号: US11740066申请日: 2007-04-25
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公开(公告)号: US07683445B2公开(公告)日: 2010-03-23
- 发明人: Srinivas V. Pietambaram , Nicholas D. Rizzo , Jon M. Slaughter
- 申请人: Srinivas V. Pietambaram , Nicholas D. Rizzo , Jon M. Slaughter
- 申请人地址: US AZ Chandler
- 专利权人: Everspin Technologies, Inc.
- 当前专利权人: Everspin Technologies, Inc.
- 当前专利权人地址: US AZ Chandler
- 代理机构: Ingrassia Fisher & Lorenz, P.C.
- 主分类号: H01L29/82
- IPC分类号: H01L29/82
摘要:
Low power magnetoelectronic device structures and methods therefore are provided. The magnetoelectronic device structure (100, 150, 450, 451) comprises a programming line (104, 154, 156, 454, 456), a magnetoelectronic device (102, 152, 452) magnetically coupled to the programming line (104, 154, 156, 454, 456), and an enhanced permeability dielectric (EPD) material (106, 108, 110, 158, 160, 162, 458, 460, 462) disposed adjacent the magnetoelectronic device. The EPD material (106, 108, 110, 158, 160, 162, 458, 460, 462) comprises multiple composite layers (408) of magnetic nano-particles (406) embedded in a dielectric matrix (409). The composition of the composite layers is chosen to provide a predetermined permeability profile. A method for making a magnetoelectronic device structure is also provided. The method comprises fabricating the magnetoelectronic device (102, 152, 452) and depositing the programming line (104, 154, 156, 454, 456). The EPD material (106, 108, 110, 158, 160, 162, 458, 460, 462) comprising the multiple composite layers (408) is formed around the magnetoelectronic device (102, 152, 452) and/or between the device (102, 152, 452) and the programming line (104, 154, 156, 454, 456). The presence of the EPD structure (470, 480, 490) in proximity to the programming line (104, 154, 156, 454, 456) and/or the magnetoelectronic device (102, 152, 452) reduces the required programming current.
公开/授权文献
- US20070284683A1 ENHANCED PERMEABILITY DEVICE STRUCTURES AND METHOD 公开/授权日:2007-12-13