发明授权
- 专利标题: Calibration apparatus, calibration method, and testing apparatus
- 专利标题(中): 校准装置,校准方法和试验装置
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申请号: US11582143申请日: 2006-10-17
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公开(公告)号: US07684944B2公开(公告)日: 2010-03-23
- 发明人: Masahiro Ishida , Toshiyuki Okayasu
- 申请人: Masahiro Ishida , Toshiyuki Okayasu
- 申请人地址: JP Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Osha • Liang LLP
- 主分类号: G06F19/00
- IPC分类号: G06F19/00
摘要:
There is provided a calibration apparatus that calibrates a jitter measuring circuit for outputting a jitter measuring signal with a level according to an amount of jitter in an input signal based on the input signal and a delay signal obtained by delaying the input signal by means of a variable delay circuit. The calibration apparatus includes a delay control section that sequentially sets a first delay amount and a second delay amount in the variable delay circuit and a gain computing section that computes gain in the jitter measuring circuit based on the jitter measuring signal respectively output from the jitter measuring circuit for the first delay amount and the second delay amount.
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