发明授权
- 专利标题: Debris prevention system, radiation system, and lithographic apparatus
- 专利标题(中): 防碎片系统,辐射系统和光刻设备
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申请号: US11826525申请日: 2007-07-16
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公开(公告)号: US07687788B2公开(公告)日: 2010-03-30
- 发明人: Maarten Marinus Johannes Wilhelmus Van Herpen , Wouter Anthon Soer , Kurt Gielissen
- 申请人: Maarten Marinus Johannes Wilhelmus Van Herpen , Wouter Anthon Soer , Kurt Gielissen
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 主分类号: H05G2/00
- IPC分类号: H05G2/00
摘要:
A debris prevention system is constructed and arranged to prevent debris that emanates from a radiation source from propagating with radiation from the radiation source into or within a lithographic apparatus. The debris prevention system includes an aperture that defines a maximum emission angle of the radiation coming from the radiation source, and a first debris barrier having a radiation transmittance. The first debris barrier includes a rotatable foil trap. The debris prevention system also includes a second debris barrier that has a radiation transmittance. The first debris barrier is configured to cover a part of the emission angle and the second debris barrier is configured to cover another part of the emission angle.
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