发明授权
US07687824B2 Method of improving surface flatness of group-III nitride crystal, substrate for epitaxial growth, and semiconductor device 有权
提高III族氮化物晶体的表面平坦度的方法,用于外延生长的衬底和半导体器件

  • 专利标题: Method of improving surface flatness of group-III nitride crystal, substrate for epitaxial growth, and semiconductor device
  • 专利标题(中): 提高III族氮化物晶体的表面平坦度的方法,用于外延生长的衬底和半导体器件
  • 申请号: US11167078
    申请日: 2005-06-24
  • 公开(公告)号: US07687824B2
    公开(公告)日: 2010-03-30
  • 发明人: Tomohiko ShibataKeiichiro AsaiShigeaki Sumiya
  • 申请人: Tomohiko ShibataKeiichiro AsaiShigeaki Sumiya
  • 申请人地址: JP Nagoya-Shi
  • 专利权人: NGK Insulators, Ltd.
  • 当前专利权人: NGK Insulators, Ltd.
  • 当前专利权人地址: JP Nagoya-Shi
  • 代理机构: Burr & Brown
  • 优先权: JP2004-192134 20040629; JP2004-329443 20041112; JP2005-132721 20050428; JP2005-168463 20050608
  • 主分类号: H01L29/24
  • IPC分类号: H01L29/24
Method of improving surface flatness of group-III nitride crystal, substrate for epitaxial growth, and semiconductor device
摘要:
A heating process is performed in a nitrogen atmosphere at a temperature of not less than 1650° C. upon an epitaxial substrate including a single crystal base and an upper layer made of a group-III nitride crystal and epitaxially formed on a main surface of the single crystal base. The result shows that the heating process reduces the number of pits in a top surface to produce the effect of improving the surface flatness of the group-III nitride crystal. The result also shows that the dislocation density in the group-III nitride crystal is reduced to not more than one-half the dislocation density obtained before the heat treatment.
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