Invention Grant
US07688091B2 Chuck with integrated wafer support 失效
带集成晶圆支架的卡盘

Chuck with integrated wafer support
Abstract:
An improved chuck with lift pins within a probe station. The chuck assembly may have an outer periphery and an upper surface. The lift pins may be positioned within the periphery of the chuck assembly and may be capable of relative vertical movement with respect to the upper surface of the chuck assembly.
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