发明授权
- 专利标题: Solid-state imaging device with specific contact arrangement
- 专利标题(中): 具有特定接触排列的固态成像装置
-
申请号: US11529256申请日: 2006-09-29
-
公开(公告)号: US07688373B2公开(公告)日: 2010-03-30
- 发明人: Makoto Inagaki , Yoshiyuki Matsunaga
- 申请人: Makoto Inagaki , Yoshiyuki Matsunaga
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2003-062282 20030307
- 主分类号: H04N5/335
- IPC分类号: H04N5/335 ; H04N3/14 ; H01L31/112
摘要:
In each photosensitive cell, a photodiode 101, a transfer gate 102, a floating diffusion layer section 103, an amplifier transistor 104, and a reset transistor 105 are formed in one active region surrounded by a device isolation region. The floating diffusion layer section 103 included in one photosensitive cell is connected not to the amplifier transistor 104 included in that cell but to the gate of the amplifier transistor 104 included in another photosensitive cell adjacent to the one photosensitive cell in the column direction. A polysilicon wire 111 connects the transfer gates 102 arranged in the same row, and a polysilicon wire 112 connects the reset transistors 105 arranged in the same row. For connection in the row direction, only polysilicon wires are used.
公开/授权文献
- US20070030372A1 Solid-state imaging device 公开/授权日:2007-02-08
信息查询