发明授权
- 专利标题: Multi-stage implant to improve device characteristics
- 专利标题(中): 多级植入物以改善装置特性
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申请号: US11769058申请日: 2007-06-27
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公开(公告)号: US07691700B2公开(公告)日: 2010-04-06
- 发明人: Manoj Mehrotra , Stan Ashburn , Shaoping Tang
- 申请人: Manoj Mehrotra , Stan Ashburn , Shaoping Tang
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Warren L. Franz; Wade J. Brady, III; Frederick J. Telecky, Jr.
- 主分类号: H01L21/8238
- IPC分类号: H01L21/8238
摘要:
One aspect of the inventors' concept relates to a method of forming a semiconductor device. In this method, a gate structure is formed over a semiconductor body. A source/drain mask is patterned over the semiconductor body implanted source and drain regions are formed that are associated with the gate structure. After forming the implanted source and drain regions, a multi-stage implant is performed on the source and drain regions that comprises at least two implants where the dose and energy of the first implant varies from the dose and energy of the second implant. Other methods and devices are also disclosed.
公开/授权文献
- US20090004803A1 MULTI-STAGE IMPLANT TO IMPROVE DEVICE CHARACTERISTICS 公开/授权日:2009-01-01
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