Invention Grant
- Patent Title: Optical characteristic measuring apparatus
- Patent Title (中): 光学特性测量仪器
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Application No.: US12186201Application Date: 2008-08-05
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Publication No.: US07692796B2Publication Date: 2010-04-06
- Inventor: Takaaki Hirata , Minoru Maeda
- Applicant: Takaaki Hirata , Minoru Maeda
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JPP.2005-159061 20050531; JPP.2005-163825 20050603; JPP.2005-171310 20050610
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
An optical characteristic measuring apparatus includes: a light source section which sweeps wavelengths of a first input light and a second input light respectively, frequencies of the first and second input lights being different from each other and polarized states of the first and second input lights being perpendicular to each other, and outputs the first and second input light; an interference section which inputs one branched light of the first and second input lights to a measuring object, makes output light from the measuring object interfere with other branched light of the first and second input lights, and outputs a plurality of interference lights; a plurality of light receiving sections which are respectively provided for the interference lights, receives the interference lights respectively, and outputs signals in accordance with optical powers of the interference lights respectively; and a low-pass filter for filtering the outputted signals.
Public/Granted literature
- US20080316495A1 OPTICAL CHARACTERISTIC MEASURING APPARATUS Public/Granted day:2008-12-25
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