发明授权
- 专利标题： Circuit testing apparatus
- 专利标题（中）： 电路检测仪
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申请号： US11806499申请日： 2007-05-31
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公开(公告)号： US07706999B2公开(公告)日： 2010-04-27
- 发明人: Cheng-Yung Teng , Li-Jieu Hsu , Jie-Wei Huang , Huei-Huang Chen
- 申请人： Cheng-Yung Teng , Li-Jieu Hsu , Jie-Wei Huang , Huei-Huang Chen
- 申请人地址： TW Taipei County
- 专利权人： Princeton Technology Corporation
- 当前专利权人： Princeton Technology Corporation
- 当前专利权人地址： TW Taipei County
- 代理机构： Muncy, Geissler, Olds & Lowe, PLLC
- 优先权： TW96205077U 20070329
- 主分类号： G01R31/26
- IPC分类号： G01R31/26 ; G06F17/40 ; G06F19/00
摘要：
The invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a precision measurement unit, a signal transformation module, and a microprocessor. The precision measurement unit is coupled to the device under test for providing a testing signal and receiving a measurement signal generated according to the testing signal. The signal transformation module is coupled to the precision measurement unit for receiving the measurement signal and transforming the measurement signal to a signal measurement result according to a predetermined manner. The microprocessor is coupled to the precision measurement unit and the signal transformation module for examining the signal measurement result to determine a test result for the device under test.
公开/授权文献
- US20080243409A1 Circuit testing apparatus 公开/授权日：2008-10-02
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