发明授权
- 专利标题: Probe used for surface enhanced vibrational spectroscopic analysis and method of manufacturing the same
- 专利标题(中): 用于表面增强振动光谱分析的探头及其制造方法
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申请号: US12110768申请日: 2008-04-28
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公开(公告)号: US07707647B2公开(公告)日: 2010-04-27
- 发明人: Kaoru Konakahara
- 申请人: Kaoru Konakahara
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2007-128271 20070514
- 主分类号: G01Q60/22
- IPC分类号: G01Q60/22
摘要:
Provided are a probe for surface enhanced vibrational spectroscopic analysis which has excellent detection sensitivity to laser light having an intensity level at which a sample is not damaged and which has a long life, and a method of manufacturing the probe. The probe for surface enhanced vibrational spectroscopic analysis is formed on a cantilever. A plurality of metal fine particles are dispersed in the probe. The plurality of metal fine particles are exposed on the surface of the probe.
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