发明授权
- 专利标题: Lithography system and projection method
- 专利标题(中): 光刻系统和投影方法
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申请号: US11521671申请日: 2006-09-15
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公开(公告)号: US07709815B2公开(公告)日: 2010-05-04
- 发明人: Remco Jager , Aukje Arianne Annette Kastelijn , Guido de Boer , Marco Jan Jaco Wieland , Stijn Willem Karel Herman Steenbrink
- 申请人: Remco Jager , Aukje Arianne Annette Kastelijn , Guido de Boer , Marco Jan Jaco Wieland , Stijn Willem Karel Herman Steenbrink
- 申请人地址: NL CJ Delft
- 专利权人: Mapper Lithography IP B.V.
- 当前专利权人: Mapper Lithography IP B.V.
- 当前专利权人地址: NL CJ Delft
- 代理机构: Blakely, Sokoloff, Taylor & Zafman
- 主分类号: G21K5/04
- IPC分类号: G21K5/04 ; G21K1/00
摘要:
The inventions relates to a lithography system in which an electronic image pattern is delivered to a exposure tool for projecting an image to a target surface, said exposure tool comprising a control unit for controlling exposure projections, said control unit at least partly being included in the projection space of the said exposure tool, and being provided with control data by means of light signals, said light signals being coupled in to said control unit by using a free space optical interconnect comprising modulated light beams that are emitted to a light sensitive part of said control unit, wherein the modulated light beams are coupled in to said light sensitive part using a holed mirror for on axis incidence of said light beams on said light sensitive part, the hole or, alternatively, holes of said mirror being provided for passage of said exposure projections.
公开/授权文献
- US20070064213A1 Lithography system and projection method 公开/授权日:2007-03-22
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