发明授权
- 专利标题: Method for testing memory
- 专利标题(中): 内存测试方法
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申请号: US11850061申请日: 2007-09-05
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公开(公告)号: US07710802B2公开(公告)日: 2010-05-04
- 发明人: Chin-Hung Chang , Wen-Chiao Ho , Kuen-Long Chang , Chun-Hsiung Hung
- 申请人: Chin-Hung Chang , Wen-Chiao Ho , Kuen-Long Chang , Chun-Hsiung Hung
- 申请人地址: TW Hsinchu
- 专利权人: Macronix International Co., Ltd.
- 当前专利权人: Macronix International Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Thomas, Kayden, Horstemeyer & Risley
- 主分类号: G11C7/00
- IPC分类号: G11C7/00
摘要:
A method for testing a memory includes the following steps. First, data is read from the memory and stored to a first temporary memory. Meanwhile, expected data corresponding to the data from the memory is written into a second temporary memory from a tester. Thereafter, the data in the first temporary memory and the expected data in the second temporary memory are compared with each other to judge whether the memory has an enough operation window.
公开/授权文献
- US20090059698A1 METHOD FOR TESTING MEMORY 公开/授权日:2009-03-05
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