发明授权
- 专利标题: Efficient storing and querying of snapshot measures
- 专利标题(中): 有效地存储和查询快照测量
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申请号: US11314733申请日: 2005-12-21
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公开(公告)号: US07711709B2公开(公告)日: 2010-05-04
- 发明人: Ashish Mittal , Edward S. Suen
- 申请人: Ashish Mittal , Edward S. Suen
- 申请人地址: US CA San Mateo
- 专利权人: Siebel Systems, Inc.
- 当前专利权人: Siebel Systems, Inc.
- 当前专利权人地址: US CA San Mateo
- 代理机构: Campbell Stephenson LLP
- 主分类号: G06F17/00
- IPC分类号: G06F17/00
摘要:
A facility for efficiently storing and querying snapshot measures from a relational data warehouse is provided. The facility allows for the efficient query of measures at any given point in time by efficiently modeling snapshot measures. In one technique, the facility stores periodic snapshots of a metric at longer time intervals, and computes intermediate snapshots of the metric as necessary in between these time intervals. Under this technique, the facility can compute an intermediate snapshot measure of a metric for any specified time by determining the last snapshot measure of the metric from the most recent periodic snapshot, and adding to the last snapshot measure the value of the changes to the metric that happened since the time of the most recent periodic snapshot and the specified time.
公开/授权文献
- US20060253414A1 Efficient storing and querying of snapshot measures 公开/授权日:2006-11-09
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