发明授权
US07712009B2 Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
有权
循环冗余校验电路和具有循环冗余校验电路的半导体器件
- 专利标题: Cyclic redundancy check circuit and semiconductor device having the cyclic redundancy check circuit
- 专利标题(中): 循环冗余校验电路和具有循环冗余校验电路的半导体器件
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申请号: US11533169申请日: 2006-09-19
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公开(公告)号: US07712009B2公开(公告)日: 2010-05-04
- 发明人: Masafumi Ito , Tomoaki Atsumi
- 申请人: Masafumi Ito , Tomoaki Atsumi
- 申请人地址: JP Atsugi-shi, Kanagawa-ken
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP Atsugi-shi, Kanagawa-ken
- 代理机构: Fish & Richardson P.C.
- 优先权: JP2005-273356 20050921
- 主分类号: H03M13/00
- IPC分类号: H03M13/00
摘要:
An object of the present invention is to provide a CRC circuit with more simple structure and low power consumption. The CRC circuit includes a first shift register to a p-th shift register, a first EXOR to a (p−1)th EXOR, and a switching circuit. A data signal, a select signal, and an output of a last stage of the p-th shift register are inputted to the switching circuit, and the switching circuit switches a first signal or a second signal in response to the select signal to be outputted.
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