发明授权
- 专利标题: Memory cell using spin induced switching effects
- 专利标题(中): 存储单元使用自旋感应开关效应
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申请号: US12036518申请日: 2008-02-25
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公开(公告)号: US07715225B2公开(公告)日: 2010-05-11
- 发明人: Wolfgang Raberg , Ulrich Klostermann
- 申请人: Wolfgang Raberg , Ulrich Klostermann
- 申请人地址: DE Munich FR Corbeil Essonnes Cedex
- 专利权人: Qimonda AG,ALTIS Semiconductor, SNC
- 当前专利权人: Qimonda AG,ALTIS Semiconductor, SNC
- 当前专利权人地址: DE Munich FR Corbeil Essonnes Cedex
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
According to an embodiment, an integrated circuit includes a magneto-resistive memory cell. The magneto-resistive memory cell includes: a first ferromagnetic layer; a second ferromagnetic layer; and a nonmagnetic layer being disposed between the first ferromagnetic layer and the second ferromagnetic layer. The integrated circuit further includes a programming circuit configured to route a programming current through the magneto-resistive memory cell, wherein the programming current programs the magnetizations of the first ferromagnetic layer and of the second ferromagnetic layer by spin induced switching effects.
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