Invention Grant
- Patent Title: Memory detecting circuit
- Patent Title (中): 存储器检测电路
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Application No.: US12202335Application Date: 2008-09-01
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Publication No.: US07715266B2Publication Date: 2010-05-11
- Inventor: Bing-Jian Li , Ning Wang , Yong-Xing You
- Applicant: Bing-Jian Li , Ning Wang , Yong-Xing You
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, Taipei Hsien
- Agent Zhigang Ma
- Priority: CN200810303229 20080730
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A memory detecting circuit includes five switch elements and two indication devices. A first switch element is connected to a standby power, and also connected to memory sockets of a first channel to receive a first memory detecting signal. A second switch element is connected to the first switch element and the standby power. A third switch element is connected to the second switch element and the standby power, and also connected to memory sockets of a second channel to receive a second memory detecting signal. A fourth switch element is connected to the third switch element and the standby power. A fifth switch element is connected to the fourth switch element and the standby power. When there are memories installed into the memory sockets of the first channel and the second channel, the second indication device indicates that the memories run in a dual channel mode.
Public/Granted literature
- US20100027307A1 MEMORY DETECTING CIRCUIT Public/Granted day:2010-02-04
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